Method for Testing Fixed Capacitors


1. Testing Small Capacitors Below 10 pF: Since fixed capacitors below 10 pF have extremely small capacitance, using a multimeter to measure them can only provide a qualitative assessment of whether they exhibit leakage, internal short circuits, or breakdown. When performing the measurement, select the multimeter’s R×10k range and connect the two test leads to any two pins of the capacitor; the resistance reading should be infinite. If the measured resistance (indicated by the needle moving to the right) is zero, it means the capacitor is damaged due to leakage or has suffered an internal breakdown.
2. Testing Fixed Capacitors Ranging from 10 pF to 0.01 μF: The condition of the capacitor—whether it is good or bad—can be determined by observing whether charging occurs. Use the R×1k range on the multimeter. Both transistors should have a β value of at least 100 and low leakage currents. A composite transistor can be constructed using silicon transistors such as the 3DG6 model. Connect the red and black leads of the multimeter to the emitter e and collector c of the composite transistor, respectively. Due to the amplifying effect of the composite transistor, the charging and discharging process of the capacitor under test is greatly amplified, causing the multimeter pointer to swing more significantly and making it easier to observe. [12]
It should be noted that during the testing process—especially when measuring capacitors with smaller capacitance—it is necessary to repeatedly swap the leads of the capacitor under test between points A and B in order to clearly observe the deflection of the multimeter’s needle. For fixed capacitors with a capacitance of 0.01 μF or higher, you can directly use the R×10k range on the multimeter to determine whether the capacitor undergoes a charging process and whether it has internal short circuits or leakage. Furthermore, by gauging the extent of the needle’s rightward deflection, you can roughly estimate the capacitor’s capacitance value.

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